1964_IMPORT_AND_EXPORT_(STRATEGIC_COMMODITIES)_REGULATIONS — Page 25

1988 Ed.]

Import and Export (Strategic Commodities) Regulations

[CAP. 60

G 25

[Subsidiary]

(4) Specially designed "stored-programme controlled" measuring and analysis

equipment;

(5) Equipment for the assembly of integrated circuits;

(6) "Stored-progranume controlled" wafer probing equipment;

(7) Test equipment as follows (for standard test instruments, see Item IL 1529);

(1) "Stored-programme controlled" equipment specially designed for testing discrete semi-conductor devices and unencapsulated dice, capable of performing any of the following functions-

(a) Measurement of time intervals of less than 10 nanoseconds;

(b) Measurement of parameters (e.g., S-parameters, noise figure) at

frequencies greater than 250 MHz

(c) Resolution of currents of less than 100 pico-amperes;

(d) Measurements of spectral response at wavelengths outside the range

from 450 to 950 nanometres;

Technical Note:

Discrete semi-conductor devices/include, for example, diodes, transistors, thyristors, photocells, and solar cells.

(ii) “Stored-programme controlled” equipment specially designed for testing integrated circuits, and assemblies thereof, capable of performing any of the following functions-

(a) Functional (truth table) testing at a pattern rate greater than 2 MHz; (b) Resolution of currents of less than 1 nanoampere;

(c) Testing of integrated circuits (not mounted on circuit boards) in

packages having more than a total of 24 terminals; or

Note:

(b) (7)(i)(c) does not embargo equipment specially designed for and dedicated to the testing of integrated circuits not embargoed by Item IL 1564/

(4) Measurement of rise times, fall times and edge placement times with

a resolution of less than 20 nanoseconds;

Technical Notes:

The terms "integrated circuits" and "assembly" are defined in Item IL 1564.

Notes:

1.

2.

Test equipment which is not of a general-purpose nature and which is specially designed for, and dedicated to, testing "assemblies" or a class of "assemblies” for home and entertainment applications is not embargoed by (b)(7)(ii).

Test equipment which is not of a general-purpose nature and which is specially designed for, and dedicated to, testing electronic com- ponents, "assemblies" or integrated circuits specifically excluded by Hem IL 1564 is not embargoed by (b)(7)(ii), provided such test équipment does not incorporate computing facilities with user- accessible programming capabilities;

(iii) Equipment specially designed for determining the performance of focal- plane arrays at wavelengths greater than 1 200 nanometres, using "stored- programme controlled" measurements or computer-aided evaluation and having any of the following characteristics-

(a) Using scanning light spot diameters of less than 0.12 mm (0.005 inch); (b) Designed for measuring photosensitive performance parameters and for evaluating frequency response, modulation transfer function, uniformity of responsivity or noise;

(c) Designed for evaluating arrays capable of creating images of greater

than 32 x 32 line elements;

(iv) Specially designed for bubble memories;

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