1988 Ed.]
Import and Export (Strategic Commodities) Regulations
[CAP. 60
G 25
[Subsidiary]
(4) Specially designed "stored-programme controlled" measuring and analysis equipment;
(5) Equipment for the assembly of integrated circuits;
(6) "Stored-programme controlled" wafer probing equipment;
(7) Test equipment as follows (for standard test instruments, see Item IL 1529);
(i) "Stored-programme controlled" equipment specially designed for testing discrete semi-conductor devices and unencapsulated dice, capable of performing any of the following functions-
(a) Measurement of time intervals of less than 10 nanoseconds;
(b) Measurement of parameters (e.g., S-parameters, noise figure) at frequencies greater than 250 MHz
(c) Resolution of currents of less than 100 pico-amperes;
(d) Measurements of spectral response at wavelengths outside the range from 450 to 950 nanometres;
Technical Note:
Discrete semi-conductor devices include, for example, diodes, transistors, thyristors, photocells, and solar cells.
(ii) "Stored-programme controlled" equipment specially designed for testing integrated circuits, and assemblies thereof, capable of performing any of the following functions-
(a) Functional (truth table) testing at a pattern rate greater than 2 MHz;
(b) Resolution of currents of less than 1 nanoampere;
(c) Testing of integrated circuits (not mounted on circuit boards) in packages having more than a total of 24 terminals; or
Note:
(b)(7)(i)(c) does not embargo equipment specially designed for and dedicated to the testing of integrated circuits not embargoed by Item IL 1564/
(4) Measurement of rise times, fall times and edge placement times with a resolution of less than 20 nanoseconds;
Technical Notes:
The terms "integrated circuits" and "assembly" are defined in Item IL 1564.
Notes:
1.
2.
Test equipment which is not of a general-purpose nature and which is specially designed for, and dedicated to, testing "assemblies" or a class of "assemblies" for home and entertainment applications is not embargoed by (b)(7)(ii).
Test equipment which is not of a general-purpose nature and which is specially designed for, and dedicated to, testing electronic components, "assemblies" or integrated circuits specifically excluded by Item IL 1564 is not embargoed by (b)(7)(ii), provided such test equipment does not incorporate computing facilities with user-accessible programming capabilities;
(iii) Equipment specially designed for determining the performance of focal-plane arrays at wavelengths greater than 1 200 nanometres, using "stored-programme controlled" measurements or computer-aided evaluation and having any of the following characteristics-
(a) Using scanning light spot diameters of less than 0.12 mm (0.005 inch);
(b) Designed for measuring photosensitive performance parameters and for evaluating frequency response, modulation transfer function, uniformity of responsivity or noise;
(c) Designed for evaluating arrays capable of creating images of greater than 32 x 32 line elements;
(iv) Specially designed for bubble memories;
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