1964_IMPORT_AND_EXPORT_(STRATEGIC_COMMODITIES)_REGULATIONS — Page 24

G 24

CAP. 60]

Import and Export (Strategic Commodities) Regulations

[1988 Ed.

[Subsidiary]

IL 1355

(d) "Stored-programme controlled" inspection equipment for the detection of defects in printed circuit boards using optical pattern comparison or other machine scanning techniques;

(e) "Stored-programme controlled" electrical test Equipment for the identification of open and short circuits on bare printed circuit boards, capable of—

(1) Continuity testing (less than or equal to 4 ohm) at a rate of 2,500 or more measurements per second; or

(2) High voltage testing (greater than or equal to 50 volts) at a rate of 10,000 or more measurements per minute;

("Stored-programme controlled" multi-spindle drills and routers having any of the following characteristics

(1) Absolute positioning accuracy of ±10 micrometres (0.0004 inch) or better; (2) Minimum time needed for drill bit changes less than or equal to 5 seconds; or (3) X and Y positioning speeds higher than or equal to 0.125 m/sec (300 inch/min) for drilling or for routing,

(g) "Stored-programme controlled" cyclic voltametric stripping equipment specially designed for printed circuit board plating bath monitoring and analysis.

Technical Note:

"Stored-programme controlled" is defined as a control using instructions stored in an electronic storage which a processor can execute in order to direct the performance of predetermined functions.

N.B.

Equipment may be "stored-programme controlled" whether the electronic storage is internal or external to the equipment.

Note:

See also Item IL 1522(b) for the embargo of printed circuit board manufacturing equipment incorporating a laser.

Equipment for the manufacture or testing of electronic components and materials, as follows, and specially designed components, accessories and "specially designed software" therefor-

(a) Equipment specially designed for the manufacture or testing of electron tubes, optical elements and specially designed components therefor embargoed by Items IL 1541, 1542, 1555, 1556, 1558 or 1559;

(b) Equipment specially designed for the manufacture or testing of semiconductor devices, integrated circuits and "assemblies", as follows, and systems incorporating or having the characteristics of such equipment-

(1) Equipment for the processing of materials for the manufacture of devices and components as specified in the heading of this sub-item;

Note:

This item does not embargo quartz crucibles specially designed for equipment embargoed by (b)(1);

(2) Masks, mask substrates, mask-making equipment and image-transfer equipment for the manufacture of devices and components as specified in the heading of this sub-item;

Technical Note:

The term "masks" refers to those used in electron beam lithography, X-ray lithography, and for ultra-violet lithography, as well as the usual ultra-violet and visible photolithography.

(3) "Stored-programme controlled" inspection equipment for the detection of defects in processed wafers, substrates or chips using optical pattern comparison or other machine scanning techniques;

Technical Note:

Conventional scanning electron microscopes, except when specially designed and instrumented for automatic pattern inspection, are not embargoed by this sub-item.