1965-HKRS30-8-55_Part06 — Page 24

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(b) Specialized parts and accessories as follows: oscilloscope plug-in units and extemal amplifiers and pre-amplifiers which have a bandwidth greater than that defined in (a)(i) above;

(c) Electronic devices for atroboscopic analysis of a signal (le, sampling devices) whether sub-assemblies or separate units, designed to be used in conjunction with an oscilloscope to permit the analysis of recurring phenomena, which increase the capabilities of an oscilloscope to permit measurements within the limits of equipment endbargoed (under (@ki) above and/or to permit the achieving in an oscilloscope of a timebase shorter than 40 nanoseconds per centimetre.

41. Photographic equipment, as follows-

(a) High-speed cinema recording cameras employing-

() Film widths 35 mm, or narrower and recording at rates exceeding 3,000 frames per second in the case of equipment using as the lighting source a steady light flow and 10,000 frames per second in the case of equipment using as the lighting source flash equipment connected to the unwinding system;

(0) Film widths greater than 35 mm. and recording at rates exceeding 64 frames per second;

(8) Other high-speed cameras capable of recording at rates in excess of

250,000 frames per second;

(c) Photographic micro-flash equipment capable of giving a flash of 1/100,000 second or shorter duration, at a minimum recurrence fre- quency of 200 flashes per second;

(a) Photographic systems specially designed for use in space vehicles;

(e) Streak cameras having writing speeds of 8 mm./microsecond and above capable of recording events which are not initiated by the camera mechanism.

42. Quartz crystals (worked or unworked) and plates, radio grade only.

41. Measuring, calibrating, counting, and time interval measuring equipment whether or not incorporating frequency standards, having one or more of the following characteristics-

(a)

(1) Consisting of, or containing, frequency measuring equipment or frequency standards designed for other than ground laboratory use with an accuracy better than part in 107;

(1) Consisting of, or containing, ground laboratory frequency stand- ards or frequency measuring equipment incorporating frequency stand- ards with a stability over 24 hours of 1 part in 100 or better;

(b) Designed for use at frequencies in excess of 1,000 Mc/s;

(c) Designed to provide a multiplicity of alterative output frequencies coor trolled by a lesser number of piezo-electric crystals or an internal or external frequency standard, except equipment in which the output frequency is selected only by manual operation either on the equipment or on a remote control unit and-

(i) Those forming multiples of a common control frequency, or

(B) Those in which the output frequency is a multiple of a common frequency which is not less than 1:1,000 part of the oscillator frequcocy and is in steps of 1 ko/s or greater;

(4) Counting equipment capable of resolving at normal input levels succes-

sive input signals with less than 0.1 microsecond time difference;

(e) Time interval measuring equipment containing counting equipment as

specified in part (d) above.

44. Dendritic produced forms of any semi-conductor material, or combination

thereof, suitable for use in diodes or transistors.

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45. Thermal detecting cells, ie, bolometers and thermocoupler detectors, radiant energy types only, with a response time constant of less than 10 milliseconds measured at the operating temperature of the cell for which the time constant reaches a minimum.

46. Electronic equipment and components, not elsewhere specifled, as follows-

(a) Assemblies and sub-assemblies constituting one or more fuacdonal dir- cuits with a component density greater than 75 parts per cubic inch (4.575 parts per cubic centimetre), and equipment containing such as- serably or sub-assembly;

(b) Modular insulator panels (including wafers) mounting single or multiple

electronic elements and specialized parts therefor.

47. Cold cathode tubes and switches, as follows-

(a) Triggered spark-gaps, having an anode delay time of 15 microseconds or less and rated for a peak current of 3,000 amperes or mote; specially designed parts therefor, and equipment incorporating such devices;

(b) Cold cathode, gas-filled, arc-discharge tubes, containing three or more

electrodes and having all of the following characteristics—

(i) Rated for an anode peak voltage of 2,500 volts or more; (i) Rated for peak currents of 300 amperes or more;

(u) An anode delay time of 10 microseconds or less; and (iv) An envelope diameter of less that 1 inch (25.4 mm).

48. Thermoelectric materials and devices, as follows

(a) Thermoelectric materials with a maximum product of the figure of merit

(2) and the temperature (T in "K) in excess of 0.75;

(b) Junctions and combinations of junctions using any of the materials in

(a) above:

(c) Heat absorbing and/or electrical power generating devices containing

any of the junctions in (8) above;

(d) Other power generating devices which generate in excess of 10 Watts per pound or 500 Walls per cubic foot of the device's basic thermoelectric components;

(e) Specialized parts, components and sub-assemblies. not elsewhere specified,

for the above devices.

49. Materials composed of crystals having spinel, bexagonal or garnet crystal structures: thin film devices; assemblies of the foregoing; and devices con- taining them; not elsewhere specified, as follows-

(a) Monocrystals of ferrites and garnets, synthetic only;

(6) Single apecture forms possessing any of the following characteristics— (1) Switching speed of 0.5 microsecond or less at the minimum field strength required for switching at 40°C.

(i) A maximum dimension less than 45 mils (1.14 mm.);

(c) Multi-aperture forms with fewer than 10 apertures possessing any of

the following characteristics-

(1) Switching speed of 1 microsecond or less at the minimum field strength required for switching at 40°C;

() A maximum dimension less than 100 mils (2.54 mm);

(d) Multi-aperture forms having 10 or more apertures;

(s) Thin film memory storage or switching devices;

(

Electrical filters in which the coupling clement makes use of the electro- mechanical properties of ferrites;